Wafer Level Reliability (WLR) (Semiconductor Academy 2)

WLR, Wafer Reliability, FEOL/BEOL Process Qualification, MOSFET/CMOS Reliability, Foundry/IC, Semiconductor Device

• This course provides a comprehensive overview of wafer level reliability and qualification for semiconductor process and devices. You'll learn critical concepts, industry standards, and best practices, equipping you with the state-of-the-art knowledge and skills to design, test, and qualify reliable process/transistor for the semiconductor foundries.

• What you will learn in this class ?

  1. FEOL/BEOL Process Qualification, we will teach you how to qualify process/device with the corresponding Industry Standard.

  2. Lifetime Models: you will learn the methods to predict transistor life under real-world conditions.

  3. We will show you the typical MOSFET reliability failure mechanisms.

  4. Wafer Level Reliability: including TDDB (time dependent dielectric breakdown), Gox VBD (gate oxide breakdown voltage), Defect Modes, PID (plasma induced damage), BTI (bias temeperature instability), HCI (hot carrier injection), EM (electromigration), SM (stress migration).

  5. Concepts of Aging Model and Aging Simulation

• Course Objectives:

  1. Understand the importance of reliability in the semiconductor industry.

  2. Learn key reliability concepts and methods.

  3. Gain hands-on knowledge of industry standards and test procedures.

• Learning Outcomes:

  1. Apply reliability principles to your work.

  2. Perform effective reliability testing and design/choose applicable test condition.

  3. Contribute to the development of reliable transistor reliability.

• This course covered key concepts, industry standards, and best practices for wafer level reliability and qualification of semiconductor process.